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X-Ray Tomography in Material Science

X-Ray Tomography in Material Science( )
Editor: Baruchel, Jose
Buffiere, Jean-Yves
Maire, Eric
Merle, Paul
Peix, Gilles
ISBN:978-2-7462-0115-6
Publication Date:Sep 2000
Publisher:Hermes science publications
Book Format:Paperback
List Price:USD $41.95
Book Details
Pages:204
Detailed Subjects: Technology & Engineering / Imaging Systems
Book Weight:0.7 Pounds



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