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Simulink Library Development and Implementation for Vlsi Testing

Simulink Library Development and Implementation for Vlsi Testing( )
Author: Singh, Gurinder Pal
Singh, Balwinder
Publication Date:May 2012
Publisher:Lap Lambert Academic Publishing GmbH & Company KG
Book Format:Paperback
List Price:USD $62.00
Book Description:

In testing two important factors which are used to check the complexity level of the CUT (Circuit under Test) is COM (Controllability and Observability Measures). Normally for their calculations standard formulas are exist. But these formulas are different for combinational and sequential circuits. Also to carry out calculation manually for all elements in a complex circuits is very tedious job. To resolve this problem user libraries are developed and embedded in to Simulink. Then a...
More Description

Book Details
Detailed Subjects: Computers / Mathematical & Statistical Software
Technology & Engineering / Electronics / Circuits / Vlsi & Ulsi
Physical Dimensions (W X L X H):6 x 9 x 0.2 Inches
Book Weight:0.3 Pounds

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