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Reliability, Yield, and Stress Burn-In

A Unified Approach for Microelectronics Systems Manufacturing and Software Development

Reliability, Yield, and Stress Burn-In( )
Author: Way Kuo, Way
Wei-Ting Kary Chien, Wei-Ting Kary
Taeho Kim, Taeho
ISBN:978-1-4613-7596-8
Publication Date:Mar 2014
Publisher:Springer
Book Format:Paperback
List Price:USD $169.99
Book Description:

The international market is very competitive for high-tech manufacturers to­ day. Achieving competitive quality and reliability for products requires leader­ ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de­ sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur­ ing both the...
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