Light-Element Analysis in the Transmission Electron Microscope WEDX and EELS |
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| Author:
| Budd, P. M.
Goodhew, Peter J. |
| Series title: | Royal Microscopical Society Microscopy Handbooks Ser. |
| ISBN: | 978-0-19-856417-1 |
| Publication Date: | Jun 1988 |
| Publisher: | Oxford University Press, Incorporated
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| Book Format: | Paperback |
| List Price: | USD $14.95 |
Book Description:
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Emphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn how to analyse for the light elements (boron, carbon, nitrogen, oxygen, and fluorine). Each technique is first described as it is used for...
More DescriptionEmphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn how to analyse for the light elements (boron, carbon, nitrogen, oxygen, and fluorine). Each technique is first described as it is used for qualitative analysis, and then quantitative analysis is developed. In a final chapter, the two techniques are compared. The book is a practical guide for biologists and for researchers in the medical, physical, and materials sciences.