High Resolution X-Ray Diffractometry and Topography |
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| Author:
| Bowen, D. K.
Tanner, Brian K. |
| ISBN: | 978-1-135-47861-2 |
| Publication Date: | Feb 1998 |
| Publisher: | CRC Press LLC
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| Book Format: | Digital (delivered electronically) |
| List Price: | USD $74.95 |
Book Description:
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The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the the
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the the