Defect Based Testing (DBT 2000)

2000 IEEE International Workshop On

(

)

Author:

ISBN:

978-0-7695-0638-8

Publication Date:

May 2000

Publisher:

IEEE Computer Society Press

Book Format:

Paperback

List Price:

USD $100.00

Book Details

Pages:	85
Detailed Subjects:	Technology & Engineering / Engineering (General)
Physical Dimensions (W X L X H):	8.5 x 11 Inches

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