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Characterization of Crystal Growth Defects by X-Ray Methods

Characterization of Crystal Growth Defects by X-Ray Methods( )
Editor: Tanner, Brian K.
Bowen, D. Keith
Series title:NATO ASI B Ser.
ISBN:978-0-306-40628-7
Publication Date:Jan 1981
Publisher:Basic Books
Book Format:Hardback
List Price:USD $110.00
Book Details
Pages:616
Detailed Subjects: Science / Physics / Crystallography



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