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Characterization of Crystal Growth Defects by X-Ray Methods
Characterization of Crystal Growth Defects by X-Ray Methods
(
)
Editor:
Tanner, Brian K.
Bowen, D. Keith
Series title:
NATO ASI B Ser.
ISBN:
978-0-306-40628-7
Publication Date:
Jan 1981
Publisher:
Basic Books
Book Format:
Hardback
List Price:
USD $110.00
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Book Details
Pages:
616
Detailed Subjects:
Science / Physics / Crystallography
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