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Built-In-Self-Test and Digital Self-Calibration for RF Socs

Built-In-Self-Test and Digital Self-Calibration for RF Socs( )
Author: Bou-Sleiman, Sleiman
Ismail, Mohammed
Series title:SpringerBriefs in Electrical and Computer Engineering Ser.
ISBN:978-1-4419-9548-3
Publication Date:Sep 2011
Publisher:Springer
Book Format:Ebook
List Price:USD $49.95
Book Description:

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Book Details
Pages:89



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