Built-in-Self-Test and Digital Self-Calibration for RF SoCs |
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| Author:
| Sleiman, Sleiman
Ismail, Mohammed |
| Series title: | SpringerBriefs in Electrical and Computer Engineering Ser. |
| ISBN: | 978-1-4419-9547-6 |
| Publication Date: | Sep 2011 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $54.99 |
Book Description:
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This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).