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2003 IEEE Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
2003 IEEE Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
(
)
Author:
IEEE Computer Society Staff,
ISBN:
978-0-7803-7951-0
Publication Date:
Jan 2003
Publisher:
IEEE
Book Format:
CD-ROM
List Price:
USD $210.00
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Book Details
Detailed Subjects:
Technology & Engineering / Electronics / Optoelectronics
Technology & Engineering / Electronics / Microelectronics
Technology & Engineering / Industrial Design / Packaging
Technology & Engineering / Electrical
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