Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
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Author:
| Stanisavljevi, Milos Schmid, Alexandre Leblebici, Yusuf |
ISBN: | 978-1-4899-8254-4 |
Publication Date: | Oct 2014 |
Publisher: | Springer
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Book Format: | Paperback |
List Price: | AUD $290.95 |
Book Description:
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This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.