Built-in-Self-Test and Digital Self-Calibration for RF SoCs |
|
| Author:
| Sleiman, Sleiman
Ismail, Mohammed |
| Series title: | SpringerBriefs in Electrical and Computer Engineering Ser. |
| ISBN: | 978-1-4419-9547-6 |
| Publication Date: | Nov 2011 |
| Publisher: | Springer
|
| Book Format: | Paperback |
| List Price: | AUD $134.95 |
Book Description:
|
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).